Wafer Wireless Temperature Measurement System
Overview
Wafer wireless temperature measurement system captures the influence of etching process and environment on wafer, provides direct and real-time temperature measurement during every critical step in chip manufacturing. Armed with this comprehensive temperature data, technology engineers will be able to characterize and fine-tune process conditions to improve technology and equipment performance, wafer quality and yield. Wafer wireless temperature measurement system is used to monitor temperature changes in the production process of cutting-edge products, breaking through the technical blockade.
Features
a.High accuracy, flexible application, fast measurement;
b.Scanning speed up to 4Hz, temperature accuracy up to 1mK;
c.Wireless communication
Parameters
Product size | Wafer diameter 300mm (12 inches) ± 0.2mm, thickness ≤ 775μm |
Power supply | Battery |
Temperature measurement range | 5℃~40℃
|
Temperature accuracy | 1mK(3σ)
|
Accuracy of repeated measuremen | <2mK(3σ)
|
Number of sensors | 66 |
Measurement Frequency | max.4Hz
|
Sensor response time | ≤1s
|
Communication interface | WiFi
|
Continuous working hours | ≤20min
|
Warranty Period | 1year |
Delivering Growth – in Asia and Beyond.