Good News | JHEAT Advances to “Innovate in Shanghai” Semi-finals!

Release time: 2026-09-18 17:00:00Number of views:

On September 16, 2026, the semi-finalist list of the 2026 “Innovate in Shanghai” International Innovation and Entrepreneurship Competition was officially announced. Standing out from numerous participating projects, Shanghai JHEAT Technology Co., Ltd. successfully advanced to the semi-finals of the Growth Enterprise Group with its temperature measurement project for front-end semiconductor processes.

As a science and innovation event held in Shanghai for fifteen consecutive years, the “Innovate in Shanghai” International Innovation and Entrepreneurship Competition is an important platform for cultivating technology-based SMEs. At the event, JHEAT’s representative took the stage and engaged in in-depth technical exchanges with on-site judges and industry-chain experts, focusing on industry pain points, technical routes, and industrialization progress in temperature measurement for front-end semiconductor processes.

Image source: Official website of the “Innovate in Shanghai” International Innovation and Entrepreneurship Competition

Built on more than 20 years of R&D expertise in temperature measurement and control, JHEAT has achieved full-line coverage from sensors to systems, and from low to high temperatures. Its measurement and control accuracy reaches the μK level, benchmarking against international first-tier brands, with products already engineered into real applications and validated by customers.

Advancing to the semi-finals is recognition, and even more so, a new starting point. For JHEAT, the real test always lies on the customer’s production line. In the future, JHEAT will continue to deepen its presence in the μK-level ultra-high-precision temperature measurement and control sector, keep refining the core technology of temperature measurement wafers, and provide more stable and independently controllable thermal management solutions for front-end semiconductor process measurement and scientific metrology platforms.


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