
From October 12 to 16, the 26th China International Industry Fair (CIIF) was held at the National Exhibition and Convention Center (Shanghai). For the first time, this year’s CIIF launched the Integrated Circuit Exhibition (the “China Chip” exhibition), bringing together resources across the semiconductor industry chain and building a high-end platform for technical exchange and industrial matchmaking. During the five-day event, Shanghai JHEAT Technology Co., Ltd. joined hands with the Shanghai Intelligent Sensor Industrial Park to present its core technologies and innovative achievements in ultra-high-precision temperature measurement and control.


At the exhibition, JHEAT highlighted four self-developed core products—the In-situ Wireless Temperature Measuring Wafer System, Mask Wireless Temperature Measurement System, RTD-Wafer Temperature Measurement System, and Wireless Pressure Measuring Wafer System—which became a key focus on site with their μK-level ultra-high-precision temperature measurement advantages. Addressing precision temperature control challenges in wafer manufacturing processes such as lithography, etching, and thin-film deposition, the JHEAT technical team held in-depth one-on-one exchanges with visiting customers, discussing high-precision temperature measurement solution adaptation, on-site application implementation, and process optimization in a lively atmosphere.




With years of dedication to ultra-high-precision temperature measurement and control, JHEAT continues to tackle core technologies for μK-level precision temperature measurement and provides precise thermal management solutions for the semiconductor industry. As a key high-tech enterprise cultivated by the Shanghai Intelligent Sensor Industrial Park, JHEAT’s presence at the CIIF “China Chip” exhibition was not only a concentrated showcase of its technical strength, but also a tangible result of the industrial park’s empowerment in connecting enterprises with high-end industry resources.

With this, JHEAT’s journey at this year’s CIIF has successfully concluded. We sincerely thank every industry colleague who visited the JHEAT booth for exchanges. Moving forward, JHEAT will continue to deepen its expertise in ultra-high-precision temperature measurement and control technology, and looks forward to working with partners from all sectors to explore the new future of precision intelligent manufacturing in the semiconductor industry!


Hu ICP Bei No. 2023002235