Wired Pressure Sensing Wafer System - Semiconductor Pressure Measurement System - Products&Services

Semiconductor Pressure Measurement System

Wired Pressure Sensing Wafer System

The Wired Pressure Sensing Wafer System consists of a wired pressure sensing wafer, a data acquisition unit, and software. It accurately measures the pressure distribution and pressure response on the wafer surface, making it suitable for wafer pressure testing across multiple application scenarios. This system delivers both high precision and practical usability.

Basic Introduction

Parameters

Wired Pressure Sensing Wafer System

Overview

Features

a.It oﬀers a wide measurement range, with non-linearity better than 0.1% FS, and a fast response time;

b.High stability, over-pressure resistance, and compatibility with both vacuum and atmosphere environments, and etc ;

c.Fast sampling speed and high accuracy;

d.Supports data storage and export (xlsx/csv) with easy and intuitive operation.

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