On May 29, 2025, the three-day 7th China Metrology Exhibition was successfully concluded in Shanghai World Expo Exhibition & Convention Center. As a deep cultivator and innovator in the field of ultra-high-precision temperature measurement and control technology, JHEAT presented a number of core technology achievements and star products at the exhibition, which comprehensively demonstrated the company's technological precipitation and innovation ability, and won wide attention and high recognition.
Precise docking, customer response is enthusiastic
On the first day, JHEAT's booth received a large number of professional customers to consult and discuss cooperation. Many customers said that they were impressed by our products, and our R&D staff and sales team also conducted in-depth communication on customer needs and project applications, laying a solid foundation for subsequent cooperation.
Further enhancement of brand influence
Through this exhibition, JHEAT not only fully demonstrated its R&D strength and industrialization capability in the field of ultra-high-precision temperature measurement and control, but also further expanded its brand influence and professional reputation in the industry, which will provide assistance for the long-term development of our company.
Future Outlook
JHEAT will take this exhibition as a new starting point, continue to increase technological innovation and market expansion in the field of metrology, focusing on the “higher accuracy, greater stability, broader adaptability” direction of research and development, and constantly promote the iterative upgrading of core products. We also look forward to working with more industry partners, and jointly help China's metrology technology, high-quality development, empowering the future of industrial intelligence, precision to a new level.
Hu ICP Bei No. 2023002235
